Mass-spectrographic analysis of high-Tc Nb-Ge sputtered films.
Autor: | Santhanam, A. T., Gavaler, J. R. |
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Zdroj: | Journal of Applied Physics; Aug1975, Vol. 46 Issue 8, p3633-3636, 4p |
Databáze: | Complementary Index |
Externí odkaz: |
Autor: | Santhanam, A. T., Gavaler, J. R. |
---|---|
Zdroj: | Journal of Applied Physics; Aug1975, Vol. 46 Issue 8, p3633-3636, 4p |
Databáze: | Complementary Index |
Externí odkaz: |