The Magnetic Electron Microscope Objective: Contour Phenomena and the Attainment of High Resolving Power.
Autor: | Hillier, James, Ramberg, E. G. |
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Zdroj: | Journal of Applied Physics; Jan1947, Vol. 18 Issue 1, p48-71, 24p |
Databáze: | Complementary Index |
Externí odkaz: |