Investigation of 1/f noise in sub-micron MOSFETs.

Autor: Vasina, Petr, Çelik-Butler, Zeynep, Amarasinghe, Nuditha Vibhavie
Zdroj: AIP Conference Proceedings; Apr1999, Vol. 466 Issue 1, p84-91, 8p
Databáze: Complementary Index