Thin-film metrology by rapid x-ray reflectometry.
| Autor: | Koppel, L. N., Parobek, L. |
|---|---|
| Zdroj: | AIP Conference Proceedings; Nov1998, Vol. 449 Issue 1, p469-473, 5p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Koppel, L. N., Parobek, L. |
|---|---|
| Zdroj: | AIP Conference Proceedings; Nov1998, Vol. 449 Issue 1, p469-473, 5p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|