Displacement damage effects in SiC JFETs as a function of temperture.

Autor:	McGarrity, James M., Oakley, Robert E., DeLancey, W. Merle, McLean, F. Barry
Zdroj:	AIP Conference Proceedings; Jan1993, Vol. 271 Issue 2, p609-615, 7p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu