Surface chemistries and electronic properties of molecular semiconductor thin films grown by effusion beams.

Autor: Lee, P., Pankow, J., Danziger, J., Nebesny, K. W., Armstrong, N. R.
Zdroj: AIP Conference Proceedings; Sep1988, Vol. 167 Issue 1, p376-385, 10p
Databáze: Complementary Index