The high resolution spectrometer facility at LAMPF.

Autor: Hoffmann, G. W., Madland, D., Morris, C. L., Pratt, J., Spencer, J. E., Tanaka, N., Thiessen, H. A., Zeidman, B., Kozlowski, T., Palevsky, H., Sutter, R., Bauer, T. H., Fong, J., Igo, G. J., Ridge, R., Rolfe, R., Whitten, C. A., Hintz, N., Kyle, G., Oothoudt, M.
Zdroj: AIP Conference Proceedings; May1978, Vol. 41 Issue 1, p547-548, 2p
Databáze: Complementary Index