ESR studies of damage processes in X-irradiated high purity a-SiO2:OH and characterization of the formyl radical defect.
| Autor: | Griscom, D. L., Stapelbroek, M., Friebele, E. J. |
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| Zdroj: | Journal of Chemical Physics; Feb1983, Vol. 78 Issue 4, p1638-1651, 14p |
| Databáze: | Complementary Index |
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