Angle-dependent SIMS artifact in the analysis of InP/InGaAs layers.
| Autor: | Weitzel, I., Hösler, W., Treichler, R., Cerva, H., Weyl, R., Criegern, R. |
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| Zdroj: | Fresenius' Journal of Analytical Chemistry; 1991, Vol. 341 Issue 1/2, p43-48, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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