Throughput Measurement of a Multilayer--Coated Schwarzschild Objective Using Synchrotron Radiation.

Autor: Kiyokura, Takanori, Maeda, Fumihiko, Watanabe, Yoshio, Iketaki, Yoshinori, Nagai, Koumei, Horikawa, Yoshiaki, Oshima, Masaharu, Shigemasa, Eiji, Yagishita, Akira
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Zdroj: Optical Review; Nov/Dec2000, Vol. 7 Issue 6, p576, 3p, 3 Diagrams, 1 Graph
Abstrakt: Deals with a study which measured the throughput of a Schwarzschild objective using undulator synchrotron radiation. Experimental details; Results and discussion.
Databáze: Complementary Index