Validity of spectrophotometric determination of refractive indices for thin dielectric films and their thicknesses.

Autor:	El-Shazly, A., El-Dessouky, T., El-Kholy, H.
Zdroj:	Acta physica Academiae Scientiarum Hungaricae; Apr1977, Vol. 42 Issue 4, p339-342, 4p
Abstrakt:	One of the familiar methods for determining the refractive index of thin dielectric films and their thicknesses is the spectrophotometric method. In this work it is shown that the applicability of the method requires the thickness investigated to exceed λ/4. The calculated refractive indices of thin dielectric films of optical thickness λ/4 were found to be lower than the correct value. [ABSTRACT FROM AUTHOR]
Databáze:	Complementary Index
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