X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation.

Autor:	Molodkin, V. B., Olikhovskii, S. I., Len, E. G., Sheludchenko, B. V., Lizunova, S. V., Kyslovs'kyy, Ye. M., Vladimirova, T. P., Kochelab, E. V., Reshetnyk, O. V., Dovganyuk, V. V., Fodchuk, I. M., Lytvynchuk, T. V., Klad'ko, V. P., Świątek, Z.
Zdroj:	Physica Status Solidi. A: Applications & Materials Science; Nov2011, Vol. 208 Issue 11, p2552-2557, 6p
Databáze:	Complementary Index
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