Interface thickness of the incompatible polymer system PS/PnBMA as measured by neutron reflectometry and ellipsometry.

Autor: Siqueira, D., Schubert, D., Erb, V., Stamm, M., Amato, J.
Zdroj: Colloid & Polymer Science; Nov1995, Vol. 273 Issue 11, p1041-1048, 8p
Abstrakt: The techniques of neutron reflectometry and spectroscopic ellipsometry are compared as methods to measure the interface width between immiscible polymers. The interface thickness of the incompatible polymer system of polystyrene (PS) and poly n-butyl methacrylate) (PnBMA) is determined by neutron reflectrometry to (6.4±0.2) nm and (8.6±0.2) nm at temperatures of 120 and 156°C, respectively. Some emphasis is put on the measurement of those values also by spectroscopic ellipsometry using the same materials. A special sample geometry is chosen for ellipsometric measurements to compensate for thickness changes of films during annealing, and the dispersions of PS and PnBMA films are determined. With respect to the determination of the interface widths, however, it turns out that in the available wavelength range of 280 to 700 nm spectroscopic ellipsometry is not sensitive enough to measure the thin interface width between PS and PnBMA films. Neutron reflectivity results obtained for PS/PnBMA are discussed with respect to the Flory-Huggins segment interaction parameter χ calculated within the approximations of meanfield theory. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index
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