DIRECT OBSERVATION OF THE MULTIPLICITY OF IMPURITY CHARGE STATES IN SEMICONDUCTORS FROM LOW-TEMPERATURE HIGH-FREQUENCY PHOTOCAPACITANCE.
| Autor: | Sah, C. T., Rosier, L. L., Forbes, L. |
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| Zdroj: | Applied Physics Letters; Nov1969, Vol. 15 Issue 10, p316-318, 3p |
| Databáze: | Complementary Index |
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