The effect of minor constituents on the electrotransport-induced failure site in thin gold films.
Autor: | Hummel, R. E., Krumeich, B. K., DeHoff, R. T. |
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Zdroj: | Applied Physics Letters; Dec1978, Vol. 33 Issue 11, p960-962, 3p |
Databáze: | Complementary Index |
Externí odkaz: |