Change of interface state spectrum in Al/SiO2/Si structures with biasing during electron irradiation.
| Autor: | Rosencher, E., Bois, D. |
|---|---|
| Zdroj: | Applied Physics Letters; 1982, Vol. 40 Issue 7, p601-603, 3p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
| Autor: | Rosencher, E., Bois, D. |
|---|---|
| Zdroj: | Applied Physics Letters; 1982, Vol. 40 Issue 7, p601-603, 3p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|