Automatic measurement of galvanomagnetic parameters of narrow-gap semiconductor devices.
| Autor: | Bespal'ko, V., Shelyag, A. |
|---|---|
| Zdroj: | Measurement Techniques; Aug1991, Vol. 34 Issue 8, p817-819, 3p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
| Autor: | Bespal'ko, V., Shelyag, A. |
|---|---|
| Zdroj: | Measurement Techniques; Aug1991, Vol. 34 Issue 8, p817-819, 3p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
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