Measuring the thickness and conductance of thin films in the course of their deposition.
| Autor: | Sterkhov, V., Tokarev, N. |
|---|---|
| Zdroj: | Measurement Techniques; Apr1974, Vol. 17 Issue 4, p552-554, 3p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
| Autor: | Sterkhov, V., Tokarev, N. |
|---|---|
| Zdroj: | Measurement Techniques; Apr1974, Vol. 17 Issue 4, p552-554, 3p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
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