Particle Sizing by Planar-Phase Doppler System.

Autor: AIZU, Yoshihisa, WASHIYAMA, Hiroyuki, MISHINA, Hiromichi
Zdroj: Optical Review; Nov1994, Vol. 1 Issue 1, p121-124, 4p
Abstrakt: Conventional phase Doppler systems are useful for sizing particles in the order of microns, but sensitive to the Gaussian beam defect which can cause sizing errors. The defect can be significant when a large size is measured. In this paper, we present a new phase Doppler system using a planar optical layout which permits large particles to be measured in a forward scattering scheme without the Gaussian beam errors. The optical system design is discussed by numerical simulation based on the Mie theory. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index