Autor: |
Ullrich, Hans-Jürgen, Uhlig, Andreas, Geise, Gerhard, Horn, Herwig, Waltinger, Hans |
Zdroj: |
Microchimica Acta; 1992, Vol. 107 Issue 3-6, p283-293, 11p |
Abstrakt: |
The X-ray interference patterns obtained by the divergent beam transmission technique (pseudo Kossel technique in transmission mode) permit an evaluation of high precision. Especially the low resolution triple intersections appearing in the pattern can be utilized for precise determination of lattice constants. For cubic crystals the parameters can be calculated directly using analytical methods. The computer graphics method is also applicable for crystal systems with low symmetry. It is shown on patterns from LiF obtained with Fe-K and Cu-K radiation that the computer graphics method provides a fast way for the precise determination of lattice constants. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
|