| Autor: |
Drüke, V., Hecker, R., Stöver, D. |
| Zdroj: |
Microchimica Acta; 1987, Vol. 91 Issue 1-6, p85-91, 7p |
| Abstrakt: |
As a nondestructive technique for depth profiling of elements the PIXE-method was applied to determine the concentration profile of elements in the near surface of oxidized metal alloys. The outer region of about 1 μm was investigated using low energy protons for X-ray excitation. A set of X-ray yield measurements was carried out at proton energies of 150 to 300 keV. The unfolding of the X-ray yields was performed by calculation of proton energy loss, X-ray production cross section and X-ray attenuation. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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