Autor: |
Ruel, K., Barnoud, F., Goring, D. |
Zdroj: |
Wood Science & Technology; Dec1978, Vol. 12 Issue 4, p287-291, 5p |
Abstrakt: |
Ultrathin cross sections of the tracheid wall in black spruce and silver fir have been examined at high resolution by scanning transmission electron microscopy (STEM) and by conventional transmission electron microscopy (TEM). For both softwoods, lamellation of the S2 layer was evident but the lamellae were seen more clearly in the STEM photomicrographs. The interlamellar distance was 7.1 nm in the case of spruce and 8.4 nm for silver fir. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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