XES investigation of the layered vanadium-substituted copper-chromium disulfides.

Autor: Korotaev, E., Fedorenko, A., Mazalov, L., Kryuchkova, N., Sokolov, V., Filatova, I., Pichugin, A., Peregudova, N., Lavrukhina, S.
Předmět:
Zdroj: Journal of Structural Chemistry; Dec2011, Vol. 52, p45-49, 5p, 1 Chart, 1 Graph
Abstrakt: XRD data on the layered vanadium-substituted copper-chromium disulfides (CuCrVS, x = 0−0.4) are compared with the data obtained by X-ray emission and photoelectron spectroscopies. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index