XES investigation of the layered vanadium-substituted copper-chromium disulfides.

Autor:	Korotaev, E., Fedorenko, A., Mazalov, L., Kryuchkova, N., Sokolov, V., Filatova, I., Pichugin, A., Peregudova, N., Lavrukhina, S.
Předmět:	CHALCOGENIDES X-ray spectroscopy ELECTROLYTES MAGNETIC semiconductors VANADIUM SULFIDES COPPER compounds
Zdroj:	Journal of Structural Chemistry; Dec2011, Vol. 52, p45-49, 5p, 1 Chart, 1 Graph
Abstrakt:	XRD data on the layered vanadium-substituted copper-chromium disulfides (CuCrVS, x = 0−0.4) are compared with the data obtained by X-ray emission and photoelectron spectroscopies. [ABSTRACT FROM AUTHOR]
Databáze:	Complementary Index
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