Diffraction measurements from crystals under electric field: instrumentation.
| Autor: | Guillot, Regis, Alle, Paul, Fertey, Pierre, Hansen, Niels K., Elkaim, Eric |
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| Zdroj: | Journal of Applied Crystallography; Jun2002, Vol. 35 Issue 3, p360, 4p |
| Abstrakt: | Presents a device built to apply strong electric fields to a crystal during the measurement of X-ray diffracted intensities using a field-switching technique. Stroboscopic technique; Impact of strain on Bragg angles; Converse piezoelectric effect. |
| Databáze: | Complementary Index |
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