Quantification procedures for electron energy-loss spectroscopy and imaging: the use of correspondence analysis for element determination.
Autor: | Gelsema, E. S., Beckers, A. L. D., Sorber, C. W. J., Bruijn, W. C. |
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Zdroj: | Journal of Microscopy; 1992, Vol. 166 Issue 3, p287-296, 10p |
Databáze: | Complementary Index |
Externí odkaz: |