Sensitivity improvement and noise reduction of array CD mapping on memory device using inspection tool.

Autor: Yeo, Jeong-Ho, Cho, Byeong-Ok, Park, Jin-Hong, Hur, Jinseok, Woo, Seok-Hoon, Choi, Seungwoon, Park, Chan-Hoon
Zdroj: Proceedings of SPIE; Nov2009 Part 2, Issue 1, p72721U-72721U-8, 8p
Databáze: Complementary Index