Results from prototype die-to-database reticle inspection system.

Autor: Mu, Bo, Dayal, Aditya, Broadbent, Bill, Lim, Phillip, Goonesekera, Arosha, Chen, Chunlin, Yeung, Kevin, Pinto, Becky
Zdroj: Proceedings of SPIE; Nov2009 Part 2, Issue 1, p72723O-72723O-8, 8p
Databáze: Complementary Index