Reflection control for immersion lithography: a single organic antireflectant over high-reflective substrates for double patterning.

Autor: Wong, Sabrina, Yu, Jeong Yun, Kim, Sue Ryeon, Mori, Mike, Kwok, Amy, O'Connell, Kathleen M., Barclay, George, Lee, Ki Lyoung, Lee, Sung Koo, Bok, Cheol Kyu
Zdroj: Proceedings of SPIE; Nov2009, Issue 1, p727318-727318-8, 8p
Databáze: Complementary Index