Improving yield through the application of process window OPC.

Autor: Tirapu Azpiroz, Jaione, Krasnoperova, Azalia, Siddiqui, Shahab, Settlemyer, Kenneth, Graur, Ioana, Stobert, Ian, Oberschmidt, James M.
Zdroj: Proceedings of SPIE; Nov2009, Issue 1, p727411-727411-13, 13p
Databáze: Complementary Index