Integration of dry etching steps for double patterning and spacer patterning processes.

Autor: Barnola, S., Lapeyre, C., Servin, I., Arvet, C., Maury, P., Mage, L.
Zdroj: Proceedings of SPIE; Nov2009 Part 2, Issue 1, p72741X-72741X-10, 10p
Databáze: Complementary Index