Evaluation of an e-beam correction strategy for compensation of EUVL mask non-flatness.

Autor: Orvek, Kevin, Sohn, Jaewoong, Choi, Jin, Engelstad, Roxann, Raghunathan, Sudharshanan, Zimmerman, John, Laursen, Thomas, Shusuke, Yoshitake, Shoki, Tsutomu
Zdroj: Proceedings of SPIE; Nov2009 Part 3, Issue 1, p73790Q-73790Q-9, 9p
Databáze: Complementary Index