Autor: |
Sugiyama, Tomohiko, Tai, Tomoyoshi, Sugino, Takashi |
Předmět: |
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Zdroj: |
Applied Physics Letters; 6/3/2002, Vol. 80 Issue 22, p4214, 3p, 4 Graphs |
Abstrakt: |
Polycrystalline boron carbon nitride (BCN) films are synthesized by plasma-assisted chemical vapor deposition. The dielectric constant is estimated from the accumulation region of capacitancevoltage characteristics of Cu/BCN/p-Si samples. It is found that the dielectric constant of the BCN film is reduced by annealing at 400 °C. The BCN film before and after annealing is characterized by Fourier transform infrared absorption measurements. The infrared absorption intensities due to the C-H and C=C bonds decrease after annealing. It is suggested that the C-H and C=C bonds are undesirable to obtain a low dielectric constant. A dielectric constant as low as 2.1 is achieved for the BCN film which is treated by annealing process. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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