| Autor: |
Jumel, J., Krapez, J. C., Lepoutre, F., Enguehard, F., Rochais, D., Neuer, G., Cataldi, M. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2002, Vol. 615 Issue 1, p1439, 8p |
| Abstrakt: |
To measure the thermal properties of C/C and C/C-SiC composites constituents, photoreflectance microscopy is used. Specific methods are developed to cope with experimental artefacts (material semi-transparency, convolution effects), so as with fibers and matrix specificities (strong thermal anisotropy, geometric effects …). Experimental results are presented demonstrating the interest of photoreflectance microscopy for a quantitative determination of the microscopic thermal properties of these complex graphite materials. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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