| Autor: |
Nicolodi, S., Harres, A., Pereira, L. G., Schmidt, J. E., de Sousa, M. A., Pelegrini, F., Viegas, A. D. C., Deranlot, C., Petroff, F., Geshev, J. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; Sep2011, Vol. 110 Issue 6, p063922, 6p |
| Abstrakt: |
This paper reports results obtained on exchange-biased IrMn/Al2O3/Co films deposited by magnetron sputtering, where the thickness of the non-magnetic insulator layer, tAl2O3, was varied. Ferromagnetic resonance and static magnetization measurements were used to study the exchange interaction between the antiferromagnet (IrMn) and ferromagnet (Co) layers. X-ray diffractometry and x-ray reflectometry as well as high-resolution transmission electron microscopy were employed for structural characterization of the films. It was found that the IrMn/Co exchange coupling decreases very abruptly with tAl2O3 being the exponential decay length at least four times smaller than the values previously reported for exchange-bias systems. Such a rapid suppression of the coupling is explained in terms of the prompt loss of the direct contact between the antiferromagnet and the ferromagnet with tAl2O3. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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