SMART precision interferometry at 794 nm.

Autor: Monnier, John D., Berger, Jean-Philippe, Millan-Gabet, Rafael, Traub, Wesley A., Carleton, Nathaniel P., Pedretti, Ettore, Coldwell, Charles M., Papaliolios, Costas D.
Zdroj: Proceedings of SPIE; Nov2003, Issue 1, p1127-1138, 12p
Databáze: Complementary Index