Diffraction-limited astronomical X-ray imaging and X-ray interferometry using normal-incidence multilayer optics.
Autor: | Windt, David L., Kahn, Steven M., Sommargren, Gary E. |
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Zdroj: | Proceedings of SPIE; Nov2003, Issue 1, p441-450, 10p |
Databáze: | Complementary Index |
Externí odkaz: |