Highly reliable oxide VCSELs for datacom applications.

Autor: Aeby, Ian, Collins, Doug, Gibson, Brian, Helms, Christopher J., Hou, Hong Q., Lou, Wenlin, Bossert, David J., Wang, Charlie X.
Zdroj: Proceedings of SPIE; Nov2003, Issue 1, p152-161, 10p
Databáze: Complementary Index