Reliability of 1.3 micron VCSELs for metro area networks.
| Autor: | Prakash, Simon R., Chirovsky, Leo M. F., Naone, Ryan L., Galt, David, Kisker, Dave W., Jackson, Andrew W. |
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| Zdroj: | Proceedings of SPIE; Nov2003, Issue 1, p44-54, 11p |
| Databáze: | Complementary Index |
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