Development of high-performance negative-tone resists for 193-nm lithography.

Autor: Hattori, Takashi, Yokoyama, Yoshiyuki, Kimura, Kaori, Yamanaka, Ryoko, Tanaka, Toshihiko, Fukuda, Hiroshi
Zdroj: Proceedings of SPIE; Nov2003, Issue 1, p175-186, 12p
Databáze: Complementary Index