Compensation of long-range process effects on photomasks by design data correction.

Autor: Bloecker, Martin, Ballhorn, Gerd, Schneider, Jens, Belic, Nikola, Eisenmann, Hans, Keogan, Danny
Zdroj: Proceedings of SPIE; Nov2003, Issue 1, p179-188, 10p
Databáze: Complementary Index