Advanced industrial fluorescence metrology used for qualification of high quality optical materials.

Autor: Engel, Axel, Becker, Hans-Juergen, Sohr, Oliver, Haspel, Rainer, Rupertus, Volker
Zdroj: Proceedings of SPIE; Nov2003, Issue 1, p182-189, 8p
Databáze: Complementary Index