Advanced industrial fluorescence metrology used for qualification of high quality optical materials.
| Autor: | Engel, Axel, Becker, Hans-Juergen, Sohr, Oliver, Haspel, Rainer, Rupertus, Volker |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov2003, Issue 1, p182-189, 8p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|