Comparative study of the roughness of optical surfaces and thin films using atomic force microscopy, x-ray scattering, and light scattering methods.
| Autor: | Kozhevnikov, Igor V., Asadchikov, Victor E., Duparre, Angela, Gilev, Oleg N., Havronin, Nikolai A., Krivonosov, Yury S., Ostashev, Vladimir I., Steinert, Joerg |
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| Zdroj: | Proceedings of SPIE; Nov1999, Issue 1, p348-354, 7p |
| Databáze: | Complementary Index |
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