Development of Cr-based attenuated phase-shift mask process for 0.18-m device generation.
Autor: | Kagami, Ichiro, Ishikawa, Kiichi, Kakuta, Daichi, Kawahira, Hiroichi |
---|---|
Zdroj: | Proceedings of SPIE; Nov1999, Issue 1, p340-349, 10p |
Databáze: | Complementary Index |
Externí odkaz: |