Development of Cr-based attenuated phase-shift mask process for 0.18-m device generation.

Autor: Kagami, Ichiro, Ishikawa, Kiichi, Kakuta, Daichi, Kawahira, Hiroichi
Zdroj: Proceedings of SPIE; Nov1999, Issue 1, p340-349, 10p
Databáze: Complementary Index