Design considerations for an electron-beam pattern generator for the 130-nm generation of masks.

Autor: Abboud, Frank E., Babin, Sergey V., Chakarian, Varoujan, Ghanbari, Abe, Innes, Robert, Raymond III, Frederick, Sagle, Allan L., Sauer, Charles A.
Zdroj: Proceedings of SPIE; Nov1999, Issue 1, p385-399, 15p
Databáze: Complementary Index