Laterally graded multilayer optics for x-ray analysis.

Autor: Schuster, Manfred R., Goebel, H., Bruegemann, Lutz, Bahr, D., Burgaezy, F., Michaelsen, Carsten, Stoermer, Michael, Ricardo, P., Dietsch, Reiner, Holz, Thomas, Mai, Hermann
Zdroj: Proceedings of SPIE; Nov1999, Issue 1, p183-198, 16p
Databáze: Complementary Index