Grid method for strain measurement in electronic packaging using optical, electronic, and atomic force microscope.
| Autor: | Zhao, Bing, Asundi, Anand K., Oh, Kim E. |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov1999, Issue 1, p260-270, 11p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|