Atomic force microscopy using small cantilevers.
| Autor: | Walters, Deron A., Viani, Mario, Paloczi, George T., Schaeffer, Tilman E., Cleveland, Jason P., Wendman, Mark A., Gurley, Gus, Elings, Virgil B., Hansma, Paul K. |
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| Zdroj: | Proceedings of SPIE; Nov1997, Issue 1, p43-47, 5p |
| Databáze: | Complementary Index |
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