Characterization and optimization of positive-tone DUV resists on TiN substrates.

Autor: Zandbergen, Peter, Gehoel-van Ansem, Wendy F., Vandenberghe, Geert, Van Driessche, Veerle, Vloeberghs, Hans
Zdroj: Proceedings of SPIE; Nov1997, Issue 1, p314-323, 10p
Databáze: Complementary Index