Optical constants from synchrotron reflectance measurements of AXAF witness mirrors 2 to 12 keV.
| Autor: | Graessle, Dale E., Burek, Anthony J., Fitch, Jonathan J., Harris, Bernard, Schwartz, Daniel A., Blake, Richard L. |
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| Zdroj: | Proceedings of SPIE; Nov1997, Issue 1, p52-64, 13p |
| Databáze: | Complementary Index |
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