Low-energy model for ion implantation of arsenic and boron into (100) single-crystal silicon.

Autor: Obradovic, Borna J., Morris, Steven J., Morris, Michael F., Tian, Shiyang, Wang, Geng, Beardmore, K., Snell, Charles M., Jackson, J., Baummann, S., Tasch Jr., Al F.
Zdroj: Proceedings of SPIE; Nov1997, Issue 1, p342-353, 12p
Databáze: Complementary Index